SPIE. Astronomical Telescopes + Instrumentation 2020
Date : 14-18th December 2020
Virtual Conference
■Soft X-ray performance of Kyoto’s event-driven X-ray astronomical SOI pixel sensor
Takeshi Go Tsuru, Ryota Kodama, Kazuho Kayama, Hiroyuki Uchida, Takaaki Tanaka, Yasuo Arai, Ikuo Kurachi, Koji Mori, Ayaki Takeda, Yusuke Nishioka, Takahiro Hida, Masataka Yukumoto, Takayoshi Kohmura, Kouichi Hagino, Mitsuki Hayashida, et al,
■Proton radiation hardness of X-ray SOI pixel detectors with pinned depleted diode structure
Mitsuki Hayashida, Takayoshi Kohmura, Kouichi Hagino, Kenji Oono, Kousuke Negishi, Keigo Yarita, Masatoshi Kitajima, Takeshi Go Tsuru, Takaaki Tanaka, Hiroyuki Uchida, et al,
■Status of x-ray imaging and spectroscopy mission (XRISM)
Makoto Tashiro, …, Takayoshi Kohmura, …, Kouichi Hagino, et al
■Soft x-ray imager (SXI) for Xtend onboard X-Ray Imaging and Spectroscopy Mission (XRISM)
Hiroshi Nakajima, …, Takayoshi Kohmura, Kouichi Hagino, et al
