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Development of Novel Electron Microscopy Techniques to Extract Obscured Information on Material Properties

2017.08.02 Wednesday

Education/Research

A research group consisting of NIMS and university researchers developed versatile spectroscopic microscopy techniques capable of simultaneously measuring a nano-thin film at a wide range of electron energy levels, from almost zero energy to high energy, using a microscope employing electron beams. The group also demonstrated the effectiveness of the technique.

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